Trak Charged Particle Toolkit - 二维带电粒子束软件

Trak Charged Particle Toolkit是计算机平台上用于带电粒子光学和离子枪设计的2D代码。该程序应用高精度有限元技术来计算单粒子轨道或模拟二维（平面或圆柱）电场和磁场中的稳态光束。特征包括束产生的电场和磁场的影响、输入分布的自动生成、自洽空间电荷限制发射和场发射。应用包括电子和离子枪、电光器件、电子显微镜、真空微电子和相对论高功率光束。该软件包包括五个组件：

• 网格（自动创建等角三角形网格）
• EStat（电场解、绘图和分析）
• PerMag（磁场解、绘图和分析）
• Trak（计算轨迹和再生场、绘图和分析）
• GenDist（粒子分布绘图和分析）

特征：

• 结合来自独立网格的计算电场和磁场的影响

• 来自多个来源的自洽空间电荷限制发射

• 高精度轨道计算，即使在电极表面附近也能

• 准确插值到停止平面以进行镜头表征

• 具有内置硬拷贝支持的交互式轨道和场绘图后处理

• 自动计算用于离子提取的自洽等离子体表面

• 二次发射模型和多代电子历史的自动跟踪

• 自动计算发射率和电流密度

• 格式化的文本输出文件可以轻松地将信息传输到用户应用程序或数学分析程序

【英文介绍】

The Trak Charged Particle Toolkit is the most advanced 2D code available on any computer platform for charged-particle optics and gun design. The program applies high-accuracy finite-element techniques to calculate single-particle orbits or to simulate steady-state beams in 2D (planar or cylindrical) electric and magnetic fields. Features include effects of beam-generated electric and magnetic fields, automatic generation of input distributions, self-consistent space-charge-limited emission, and field emission. Applications include electron and ion guns, electro-optical devices, electron microscopes, vacuum microelectronics and relativistic high-power beams. The package includes five linked components: Mesh (automatically create conformal triangular meshes), EStat (electric-field solutions, plots and analysis), PerMag (magnetic-field solutions, plots and analysis) and Trak (calculate trajectories and regenerate fields, plots and analysis) and GenDist (plots and analysis of particle distributions).

Features

• Combine effects of calculated electric and magnetic fields from independent meshes

• Self-consistent space-charge-limited emission from multiple sources

• High accuracy orbit calculations, even near electrode surfaces

• Precision interpolation to stopping planes for lens characterization

• Interactive orbit and field plotting postprocessor with built-in hardcopy support

• Automatic calculation of self-consistent plasma surfaces for ion extraction

• Advanced secondary- emission models and automatic tracking of multi-generational electron histories

• Automatic calculations of emittance and current density

• Formatted text output files make it easy to transfer information to user applications or to mathematical analysis programs